I may be misreading what you're saying but some of your conclusions are incorrect. You cannot conclude if rays 2 and 5 will be in phase or not just based on the type of reflection from the second interface. The phase difference will also depend on the additional distance traveled by the ray inside the thin film. For the same media you will get both constructive and destructive interference (and whatever is in between) for different wavelengths.
Let's consider the case when the reflection does not change the phase. In that case the shortest additional distance that ray 5 needs to travel to have constructive interference with ray 2 is λ (the wavelength of the light). That means that if the thickness of the film is λ/2, you'll get constructive interference for λ. You can also add nλ to the path of ray 5 without changing anything, so you'll get constructive interference for all thicknesses which are (n+1)λ/2. In a similar way, you'll get destructive interference when the thickness is λ/4+nλ/2.
The case where there is a phase change during the reflection can be derived in the same way, except you get an additional π of phase change, so you'll end up with λ/4+nλ/2 for constructive and (n+1)λ/2 for destructive interference.
I don't know if you should know the formulas or not but you do need to know that there is a combination of thickness, wavelength and type of media which gives you constructive/destructive interference. Changing any of the three will change the interference results.